Micron chooses Hyperstone to provide high-reliability eUSB 3.1 storage solution
Hyperstone’s U9 - USB 3.1 Flash Memory controller and Flash Management technology has been integrated into Micron’s new eU500 embedded universal serial bus device. Both companies cooperated to bring a robust Flash storage solution to market that is specifically tailored to satisfy highest quality, endurance and reliability requirements.
The U9, together with Hyperstone’s hyMap Flash translation layer and hyReliability firmware feature-set, provides enhanced endurance and data retention management, as well as rigorous power fail-safe features. Its Read Disturb Management and Dynamic Data Refresh features maximize data retention and refresh data that is subject to read disturbance. The U9 complements Micron’s Flash technology to enable eUSB for demanding markets.
The eU500 is fully compliant with USB 3.1 Gen 1, SuperSpeed, Hi-Speed, and Full-Speed modes achieving significantly superior performance compared to USB 2.0 solutions while maintaining backward compatibility. With a sequential read/write speed of up to 170/120 MB/s and a Steady State 4K random read/write performance of 3,000/1,000 IOPS, this eUSB device offers great performance across many usage patterns – its fast random access makes it ideal for rapid boot-up and data logging. Its small size (36.9 x 26.6 x 6.6 mm) and the low power consumption of the U9 controller (less than 300mW when actively reading or writing data) allows it to be used in space and power-constrained situations. Micron’s eU500 is optimized for next generation IoT, for boot drives and data logging applications such as networking, embedded computing and server.